The atomic force microscope (AFM)
is capable of imaging insulating
materials with atomic resolution,
thus making it an excellent tool for
studying polymer surfaces. Atomic
force microscopy can be used to
measure many properties of polymers
as well as surface structure, including
friction, adhesion, and viscoelasticity.
All of these measurements can be
done without damaging preparative
processes, such as metallic coating
or placement in vacuums, which are
common with many other analytical
techniques. Additionally, AFM
measurements can be performed at
the molecular level.
Atomic force microscopy was first
applied to a polymer surface in 1988
(1); it has subsequently become a
standard research tool in the field.
This application note will focus on
the utility of AFM for investigating
various temperature- and humidity-
dependent properties of polymers.